High-Accuracy, High-Speed (AOI) Automated Optical Inspection Systems

For automated defect detection and high-accuracy measurements

These systems are perfect for a wide range of applications including MicroElectroMechanical systems (for MEMS inspection or MEMS measurement), semiconductor & discrete device inspection and measurement.

These are multi-processor based automated inspection systems that support concurrent image analysis and stage motion.

• Complete, fully-contained, self-standing unit.
• Full gantry configuration (i.e. the camera moves over the parts; the parts themselves do not move).
• Available with high-speed 240 VAC servomotor motion system.
• Available in a wide range of travels, short and long.
• Available with application-specific camera / optics / illumination module.
• Available with a resolution as fine as 0.1 micron.
• Optional LASER module for laser profiling is also available.
• Easy to use, easy to program, fully automated inspection system. 
• Inspection and measurement programs (i.e. "recipes") are easily created and modified using intuitive Graphical User Interface. Programs can be saved to disk and read-in later on.
• These systems have a wide range of tools for:

See sample video clips of the system in action ("*.wmv" format):

Low resolution:

High resolution:

Download a "pdf" file with more information: