Probe cards are sensible equipment used to test and benchmark semiconductor wafers. The thousands of sensible probe
needles present on a probe card can be placed as close as 20 microns apart and need to be placed at the exact spot for the probing process to be
successful. Our VisionGaugeŽ OnLine's automated optical inspection (AOI) systems can accurately measure probe cards with great accuracy.
Our systems are assembled with different levels of magnification, and
they posses motion encoder accuracy up to 0.1 micron in three dimensions.
VisionGaugeŽ Online is easy to use and with it you can program the system
so the inspection is fully automated or you can use the system manually
with the help of a joystick.
VisionGaugeŽ
Online includes many features to make your automated
measurements effective and efficient. The software is capable of
auto-focus, which provides you with accurate and highly repeatable
results. These systems are available with reflected or direct
lighting.
You can automatically save measurement results, save the images with measurement tags attached to them, control input and output signals based on inspection results, and even automatically create reports with this information. For any type of probe card measurement application, VisionGaugeŽ Online Machine Vision Systems are right for you. For more information, please contact us .